Peter M. Hoffmann
Peter M. Hoffmann
Wayne State University, Department of Physics and Astronomy
Verified email at wayne.edu - Homepage
TitleCited byYear
Dynamic solidification in nanoconfined water films
SH Khan, G Matei, S Patil, PM Hoffmann
Physical review letters 105 (10), 106101, 2010
1362010
Energy dissipation in atomic force microscopy and atomic loss processes
PM Hoffmann, S Jeffery, JB Pethica, HÖ Özer, A Oral
Physical review letters 87 (26), 265502, 2001
1282001
Nucleation and growth of copper on TiN from pyrophosphate solution
A Radisic, JG Long, PM Hoffmann, PC Searson
Journal of the Electrochemical Society 148 (1), C41-C46, 2001
1282001
Direct measurement of molecular stiffness and damping in confined water layers
S Jeffery, PM Hoffmann, JB Pethica, C Ramanujan, H Ozgur Ozer, A Oral
Physical Review-Section B-Condensed Matter 70 (5), 54114-54114, 2004
1252004
Life's ratchet: how molecular machines extract order from chaos
PM Hoffmann
Basic, 2012
842012
Island growth in electrodeposition
L Guo, G Oskam, A Radisic, PM Hoffmann, PC Searson
Journal of Physics D: Applied Physics 44 (44), 443001, 2011
822011
Solid or liquid? Solidification of a nanoconfined liquid under nonequilibrium conditions
S Patil, G Matei, A Oral, PM Hoffmann
Langmuir 22 (15), 6485-6488, 2006
682006
Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope
PM Hoffmann, A Oral, RA Grimble, H Özgür Özer, S Jeffery, JB Pethica
Proceedings of the Royal Society of London. Series A: Mathematical, Physical …, 2001
642001
In situ measurements of interface states at silicon surfaces in fluoride solutions
G Oskam, PM Hoffmann, PC Searson
Physical review letters 76 (9), 1521, 1996
581996
Growth kinetics for copper deposition on Si (100) from pyrophosphate solution
PM Hoffmann, A Radisic, PC Searson
Journal of The Electrochemical Society 147 (7), 2576, 2000
572000
Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy
A Oral, RA Grimble, HÖ Özer, PM Hoffmann, JB Pethica
Applied Physics Letters 79 (12), 1915-1917, 2001
452001
A highly sensitive atomic force microscope for linear measurements of molecular forces in liquids
S Patil, G Matei, H Dong, PM Hoffmann, M Karaköse, A Oral
Review of Scientific Instruments 76 (10), 103705, 2005
422005
Energetics and kinetics of surface states at n-type silicon surfaces in aqueous fluoride solutions
G Oskam, PM Hoffmann, JC Schmidt, PC Searson
The Journal of Physical Chemistry 100 (5), 1801-1806, 1996
371996
How molecular motors extract order from chaos (a key issues review)
PM Hoffmann
Reports on Progress in Physics 79 (3), 032601, 2016
292016
Copper metallization structure and method of construction
G Oskam, PC Searson, PM Vereecken, JG Long, PM Hoffmann
US Patent 6,309,969, 2001
282001
Tracer diffusion in nanofluids measured by fluorescence correlation spectroscopy
V Subba-Rao, PM Hoffmann, A Mukhopadhyay
Journal of Nanoparticle Research 13 (12), 6313-6319, 2011
272011
Revisiting the value of competition assays in folate receptor-mediated drug delivery
SK Jones, A Sarkar, DP Feldmann, P Hoffmann, OM Merkel
Biomaterials 138, 35-45, 2017
242017
Electrical properties of n‐type (111) Si in aqueous K 4Fe (CN) 6 solution I. Interface states and recombination impedance
G Oskam, JC Schmidt, PM Hoffmann, PC Searson
Journal of The Electrochemical Society 143 (8), 2531-2537, 1996
241996
Dynamics of small amplitude, off-resonance AFM
PM Hoffmann
Applied Surface Science 210 (1-2), 140-145, 2003
232003
Small‐Amplitude Atomic Force Microscopy
SV Patil, PM Hoffmann
Advanced Engineering Materials 7 (8), 707-712, 2005
182005
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Articles 1–20