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Peter M. Hoffmann
Peter M. Hoffmann
Dean and Professor of Physics, Embry-Riddle Aeronautical University
Verified email at erau.edu - Homepage
Title
Cited by
Cited by
Year
Dynamic solidification in nanoconfined water films
SH Khan, G Matei, S Patil, PM Hoffmann
Physical review letters 105 (10), 106101, 2010
1952010
Island growth in electrodeposition
L Guo, G Oskam, A Radisic, PM Hoffmann, PC Searson
Journal of Physics D: Applied Physics 44 (44), 443001, 2011
1922011
Life's ratchet: how molecular machines extract order from chaos
PM Hoffmann
Basic, 2012
1882012
Nucleation and growth of copper on TiN from pyrophosphate solution
A Radisic, JG Long, PM Hoffmann, PC Searson
Journal of the Electrochemical Society 148 (1), C41, 2001
1532001
Energy dissipation in atomic force microscopy and atomic loss processes
PM Hoffmann, S Jeffery, JB Pethica, HÖ Özer, A Oral
Physical Review Letters 87 (26), 265502, 2001
1502001
Direct measurement of molecular stiffness and damping in confined water layers
S Jeffery, PM Hoffmann, JB Pethica, C Ramanujan, H Ozgur Ozer, A Oral
Physical Review-Section B-Condensed Matter 70 (5), 54114-54114, 2004
1442004
How molecular motors extract order from chaos (a key issues review)
PM Hoffmann
Reports on Progress in Physics 79 (3), 032601, 2016
802016
Solid or liquid? Solidification of a nanoconfined liquid under nonequilibrium conditions
S Patil, G Matei, A Oral, PM Hoffmann
Langmuir 22 (15), 6485-6488, 2006
792006
Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope
PM Hoffmann, A Oral, RA Grimble, H Özgür Özer, S Jeffery, JB Pethica
Proceedings of the Royal Society of London. Series A: Mathematical, Physical …, 2001
782001
Revisiting the value of competition assays in folate receptor-mediated drug delivery
SK Jones, A Sarkar, DP Feldmann, P Hoffmann, OM Merkel
Biomaterials 138, 35-45, 2017
682017
Growth kinetics for copper deposition on Si (100) from pyrophosphate solution
PM Hoffmann, A Radisic, PC Searson
Journal of the Electrochemical Society 147 (7), 2576, 2000
632000
In situ measurements of interface states at silicon surfaces in fluoride solutions
G Oskam, PM Hoffmann, PC Searson
Physical review letters 76 (9), 1521, 1996
621996
A highly sensitive atomic force microscope for linear measurements of molecular forces in liquids
S Patil, G Matei, H Dong, PM Hoffmann, M Karaköse, A Oral
Review of Scientific Instruments 76 (10), 2005
572005
Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy
A Oral, RA Grimble, HÖ Özer, PM Hoffmann, JB Pethica
Applied Physics Letters 79 (12), 1915-1917, 2001
472001
Energetics and kinetics of surface states at n-type silicon surfaces in aqueous fluoride solutions
G Oskam, PM Hoffmann, JC Schmidt, PC Searson
The Journal of Physical Chemistry 100 (5), 1801-1806, 1996
431996
Tracer diffusion in nanofluids measured by fluorescence correlation spectroscopy
V Subba-Rao, PM Hoffmann, A Mukhopadhyay
Journal of Nanoparticle Research 13, 6313-6319, 2011
382011
Quantitative understanding of biosystems: an introduction to biophysics
TM Nordlund, PM Hoffmann
CRC press, 2011
362011
Electrical Properties of n‐Type (111) Si in Aqueous K 4Fe (CN) 6 Solution: I. Interface States and Recombination Impedance
G Oskam, JC Schmidt, PM Hoffmann, PC Searson
Journal of the Electrochemical Society 143 (8), 2531, 1996
321996
Copper metallization structure and method of construction
G Oskam, PC Searson, PM Vereecken, JG Long, PM Hoffmann
US Patent 6,309,969, 2001
282001
Analysis of the impedance response due to surface states at the semiconductor/solution interface
PM Hoffmann, G Oskam, PC Searson
Journal of applied physics 83 (8), 4309-4323, 1998
281998
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