M K Tiwari
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A test beamline on diamond light source
KJS Sawhney, IP Dolbnya, MK Tiwari, L Alianelli, SM Scott, GM Preece, ...
AIP conference proceedings 1234 (1), 387-390, 2010
An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications
AG Karydas, M Czyzycki, JJ Leani, A Migliori, J Osan, M Bogovac, ...
Journal of synchrotron radiation 25 (1), 189-203, 2018
Pulsed laser deposition of metal films and nanoparticles in vacuum using subnanosecond laser pulses
RA Ganeev, U Chakravarty, PA Naik, H Srivastava, C Mukherjee, ...
Applied optics 46 (8), 1205-1210, 2007
A microfocus X-ray fluorescence beamline at Indus-2 synchrotron radiation facility
MK Tiwari, P Gupta, AK Sinha, SR Kane, AK Singh, SR Garg, CK Garg, ...
Journal of synchrotron radiation 20 (2), 386-389, 2013
Direct determination of oxidation states of uranium in mixed-valent uranium oxides using total reflection X-ray fluorescence X-ray absorption near-edge spectroscopy
K Sanyal, A Khooha, G Das, MK Tiwari, NL Misra
Analytical chemistry 89 (1), 871-876, 2017
Structural, optical, and nonlinear optical properties of indium nanoparticles prepared by laser ablation
RA Ganeev, AI Ryasnyanskiy, U Chakravarty, PA Naik, H Srivastava, ...
Applied Physics B 86 (2), 337-341, 2007
Sample preparation for evaluation of detection limits in X-ray fluorescence spectrometry
MK Tiwari, AK Singh, KJS Sawhney
Analytical sciences 21 (2), 143-147, 2005
The effect of substitution of Mn by Fe and Cr on the martensitic transition in the Ni50Mn34In16 alloy
VK Sharma, MK Chattopadhyay, SK Nath, KJS Sokhey, R Kumar, P Tiwari, ...
Journal of Physics: Condensed Matter 22 (48), 486007, 2010
Structural asymmetry of Si/Fe and Fe/Si interface in Fe/Si multilayers
SR Naik, S Rai, MK Tiwari, GS Lodha
Journal of Physics D: Applied Physics 41 (11), 115307, 2008
Investigations of structural defects, crystalline perfection, metallic impurity concentration and optical quality of flat-top KDP crystal
SK Sharma, S Verma, Y Singh, KS Bartwal, MK Tiwari, GS Lodha, ...
Optical Materials 46, 329-338, 2015
Analysis of stainless steel samples by energy dispersive X-ray fluorescence (EDXRF) spectrometry
MK Tiwari, AK Singh, KJS Sawhney
Bulletin of Materials Science 24 (6), 633-638, 2001
Applications of the ‘CATGIXRF’computer program to the grazing incidence X‐ray fluorescence and X‐ray reflectivity characterization of thin films and surfaces
MK Tiwari, GS Lodha, KJS Sawhney
X‐Ray Spectrometry: An International Journal 39 (2), 127-134, 2010
Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2
G Das, SR Kane, A Khooha, AK Singh, MK Tiwari
Review of Scientific Instruments 86 (5), 055102, 2015
Contrasting magnetic behavior of and alloys
MK Chattopadhyay, MA Manekar, VK Sharma, P Arora, P Tiwari, ...
Journal of Applied Physics 108 (7), 073909, 2010
Probing the average size of self-assembled metal nanoparticles using x-ray standing waves
MK Tiwari, KJS Sawhney, TL Lee, SG Alcock, GS Lodha
Physical Review B 80 (3), 035434, 2009
An interactive graphical user interface (GUI) for the CATGIXRF program–for microstructural evaluation of thin film and impurity doped surfaces
MK Tiwari, G Das
X‐Ray Spectrometry 45 (4), 212-219, 2016
Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis
MK Tiwari, B Gowrishankar, VK Raghuvanshi, RV Nandedkar, ...
Bulletin of Materials Science 25 (5), 435-441, 2002
L i (i= 1–3) subshell X-ray production cross sections and fluorescence yields for some elements with 56⩽ Z⩽ 68 at 22.6 keV
Y Chauhan, MK Tiwari, S Puri
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008
Characterization of germanium linear kinoform lenses at Diamond Light Source
L Alianelli, KJS Sawhney, MK Tiwari, IP Dolbnya, R Stevens, ...
Journal of synchrotron radiation 16 (3), 325-329, 2009
Investigation of metal nanoparticles on a Si surface using an x-ray standing wave field
MK Tiwari, GM Bhalerao, M Babu, AK Sinha, C Mukherjee
Journal of Applied Physics 103 (5), 054311, 2008
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