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Frank Liu
Frank Liu
Verified email at ornl.gov
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Cited by
Cited by
Year
The impact of NBTI effect on combinational circuit: Modeling, simulation, and analysis
W Wang, S Yang, S Bhardwaj, S Vrudhula, F Liu, Y Cao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (2), 173-183, 2009
3502009
Full chip leakage estimation considering power supply and temperature variations
H Su, F Liu, A Devgan, E Acar, S Nassif
Proceedings of the 2003 international symposium on Low power electronics and …, 2003
3452003
The impact of NBTI on the performance of combinational and sequential circuits
W Wang, S Yang, S Bhardwaj, R Vattikonda, S Vrudhula, F Liu, Y Cao
Proceedings of the 44th annual Design Automation Conference, 364-369, 2007
2862007
Model order-reduction of RC (L) interconnect including variational analysis
Y Liu, LT Pileggi, AJ Strojwas
Proceedings of the 36th annual ACM/IEEE Design Automation Conference, 201-206, 1999
1961999
Impact of interconnect variations on the clock skew of a gigahertz microprocessor
Y Liu, SR Nassif, LT Pileggi, AJ Strojwas
Proceedings of the 37th Annual Design Automation Conference, 168-171, 2000
1782000
A test structure for characterizing local device mismatches
K Agarwal, F Liu, C McDowell, S Nassif, K Nowka, M Palmer, D Acharyya, ...
2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers., 67-68, 2006
1402006
A general framework for spatial correlation modeling in VLSI design
F Liu
2007 44th ACM/IEEE Design Automation Conference, 817-822, 2007
1302007
Rigorous extraction of process variations for 65-nm CMOS design
W Zhao, F Liu, K Agarwal, D Acharyya, SR Nassif, KJ Nowka, Y Cao
IEEE Transactions on Semiconductor Manufacturing 22 (1), 196-203, 2009
1262009
Variational delay metrics for interconnect timing analysis
K Agarwal, D Sylvester, D Blaauw, F Liu, S Nassif, S Vrudhula
Proceedings of the 41st annual Design Automation Conference, 381-384, 2004
1152004
Sparse and efficient reduced order modeling of linear subcircuits with large number of terminals
P Feldmann, F Liu
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004 …, 2004
1122004
Statistical modeling and simulation of threshold variation under random dopant fluctuations and line-edge roughness
Y Ye, F Liu, M Chen, S Nassif, Y Cao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (6), 987-996, 2010
1072010
Modeling interconnect variability using efficient parametric model order reduction
P Li, T Liu, X Li, LT Pileggi, SR Nassif
Design, Automation and Test in Europe, 958-963, 2005
982005
A delay metric for RC circuits based on the Weibull distribution
F Liu, C Kashyap, CJ Alpert
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided …, 2002
972002
Predicting variability in nanoscale lithography processes
DG Drmanac, F Liu, LC Wang
2009 46th ACM/IEEE Design Automation Conference, 545-550, 2009
752009
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
Y Ye, F Liu, S Nassif, Y Cao
Proceedings of the 45th annual Design Automation Conference, 900-905, 2008
752008
Modeling and analysis of non-rectangular gate for post-lithography circuit simulation
R Singhal, A Balijepalli, A Subramaniam, F Liu, S Nassif, Y Cao
Proceedings of the 44th annual Design Automation Conference, 823-828, 2007
732007
Virtual probe: a statistical framework for low-cost silicon characterization of nanoscale integrated circuits
W Zhang, X Li, F Liu, E Acar, RA Rutenbar, RD Blanton
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011
682011
Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees
CV Kashyap, CJ Alpert, F Liu, A Devgan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
632004
A heuristic to determine low leakage sleep state vectors for CMOS combinational circuits
RM Rao, F Liu, JL Burns, RB Brown
ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No …, 2003
572003
SAR image despeckling via bilateral filtering
WG Zhang, F Liu, LC Jiao
Electronics letters 45 (15), 781-783, 2009
532009
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Articles 1–20