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Babar K. Minhas
Babar K. Minhas
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Year
Midinfrared resonant magnetic nanostructures exhibiting a negative permeability
S Zhang, W Fan, BK Minhas, A Frauenglass, KJ Malloy, SRJ Brueck
Physical review letters 94 (3), 037402, 2005
4292005
Enhanced infrared transmission through subwavelength coaxial metallic arrays
W Fan, S Zhang, B Minhas, KJ Malloy, SRJ Brueck
Physical review letters 94 (3), 033902, 2005
2752005
Ellipsometric scatterometry for the metrology of sub-0.1-μm-linewidth structures
BK Minhas, SA Coulombe, SSH Naqvi, JR McNeil
Applied optics 37 (22), 5112-5115, 1998
1121998
The effects of an electromagnetic crystal substrate on a microstrip patch antenna
K Agi, M Mojahedi, B Minhas, E Schamiloglu, KJ Malloy
IEEE transactions on Antennas and Propagation 50 (4), 451-456, 2002
632002
Scatterometry measurement of sub-0.1 μm linewidth gratings
SA Coulombe, BK Minhas, CJ Raymond, S Sohail H. Naqvi, JR McNeil
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998
561998
Metallic inductive and capacitive grids: theory and experiment
BK Minhas, W Fan, K Agi, SRJ Brueck, KJ Malloy
JOSA A 19 (7), 1352-1359, 2002
502002
Identity of the cross-reflection coefficients for symmetric surface-relief gratings
PC Logofătu, SA Coulombe, BK Minhas, JR McNeil
josa a 16 (5), 1108-1114, 1999
421999
Ellipsometric scatterometry for sub-0.1-um CD measurements
SA Coulombe, PC Logofatu, BK Minhas, SSH Naqvi, JR McNeil
Metrology, Inspection, and Process Control for Microlithography XII 3332 …, 1998
401998
Toward sub-0.1-um CD measurements using scatterometry
BK Minhas, SL Prins, SSH Naqvi, JR McNeil
Metrology, Inspection, and Process Control for Microlithography X 2725, 729-739, 1996
281996
Deeply etched grating structures for enhanced absorption in thin c-Si solar cells
SH Zaidi, R Marquadt, B Minhas, JW Tringe
Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists …, 2002
222002
High gain and wide-band aperture-coupled microstrip patch antenna with mounted horn integrated on FR4 for 60 GHz communication systems
WT Sethi, H Vettikalladi, BK Minhas, MA Alkanhal
2013 IEEE Symposium on Wireless Technology & Applications (ISWTA), 359-362, 2013
162013
Fabrication of 1D and 2D vertical nanomagnetic resonators
S Zhang, W Fan, BK Minhas, A Frauenglass, KJ Malloy, SRJ Brueck
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004
72004
Over 80% subwavelength transmission in annular coaxial metallic arrays
W Fan, S Zhang, B Minhas, KJ Malloy, SRJ Brueck
InternationalQuantum Electronics Conference, 2004.(IQEC)., 1156-1157, 2004
12004
Massively parallel solution of the inverse scattering problem for integrated circuit quality control
RW Leland, BL Draper, S Naqvi, B Minhas
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 1997
11997
Study of the convergence behavior of the vectorial modal method for metallic lamellar gratings
BK Minhas
Modeling Aspects in Optical Metrology III 8083, 128-136, 2011
2011
Papers from the 48th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication-Nanomagnetics and Nanophotonics-Fabrication of 1D and 2D vertical …
S Zhang, W Fan, BK Minhas, A Frauenglass, KJ Malloy, SRJ Brueck
Journal of Vacuum Science and Technology-Section B 22 (6), 3327-3330, 2004
2004
Numerical modeling of periodic structures: Metallic grids and metamaterials
BK Minhas
The University of New Mexico, 2003
2003
Interferometric Lithography for Infrared Two-Dimensional Photonic Crystals
W Fan, B Minhas
Proceedings of the International Instrumentation Symposium 45, 185-190, 1999
1999
DIFFRACTIVE OPTICS AND MICRO-OPTICS: MODELING, DESIGN, FABRICATION, AND APPLICATIONS-Grating Analysis-Identity of the cross-reflection coefficients for symmetric surface-relief …
PC Logofatu, SA Coulombe, BK Minhas, JR McNeil
Journal of the Optical Society of America-A-Optics Image Science and Vision …, 1999
1999
Ellipsometric-Scatterometry for sub-0.1 m CD measurements [3332-31]
SA Coulombe, PC Logofatu, BK Minhas, S Sohail, H Naqvi, JR McNeil
PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 282-295, 1998
1998
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