Depth range of primary electrons, electron beam broadening, and spatial resolution in electron-beam studies FA Lukiyanov, EI Rau, RA Sennov Bulletin of the Russian Academy of Sciences: Physics 73, 441-449, 2009 | 44 | 2009 |
Comparison of experimental and Monte Carlo simulated BSE spectra of multilayered structures andin-depth'measurements in a SEM E Rau, H Hoffmeister, R Sennov, H Kohl Journal of Physics D: Applied Physics 35 (12), 1433, 2002 | 27 | 2002 |
Analysis of mechanisms of dielectric target charging under the effect of electron irradiation EN Evstaf’eva, EI Rau, VN Mileev, LS Novikov, SA Ditsman, RA Sennov Inorganic Materials: Applied Research 2, 106-113, 2011 | 20 | 2011 |
Depth of path of primary electrons, spreading of an electron beam and spatial resolution in electron probe studies FA Lukyanov, EI Rau, RA Sennov Izvestia RAN. Physical series 73 (4), 463-472, 2009 | 12 | 2009 |
Characterization of semiconductor detectors of (1–30)-keV monoenergetic and backscattered electrons AV Gostev, SA Ditsman, VV Zabrodskii, NV Zabrodskaya, FA Luk’yanov, ... Bulletin of the Russian Academy of Sciences: Physics 72, 1456-1461, 2008 | 7 | 2008 |
Methodological aspects of the electron-beam investigation of dielectric target charging EN Evstaf’eva, E Plies, EI Rau, RA Sennov, AA Tatarintsev, BG Freinkman Bulletin of the Russian Academy of Sciences: Physics 74, 979-987, 2010 | 6 | 2010 |
Experimental and computational study of the mean energy of electrons backscattered from surface films M Dapor, EI Rau, RA Sennov Journal of Applied Physics 102 (6), 2007 | 6 | 2007 |
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopy MN Filippov, EI Rau, RA Sennov, A Boyde, RGT Howell Scanning 23 (5), 305-312, 2001 | 6 | 2001 |
A method and devices of electron microtomography in scanning electron microscopy AV Gostev, SA Ditsman, FA Luk’yanov, NA Orlikovskii, EI Rau, RA Sennov Instruments and Experimental Techniques 53, 581-590, 2010 | 5 | 2010 |
Determination of the mean energy of backscattered electrons in dependence on the exit angle AV Gostev, SA Ditsman, VG Dyukov, FA Luk’yanov, EI Rau, RA Sennov Bulletin of the Russian Academy of Sciences: Physics 74, 969-978, 2010 | 5 | 2010 |
Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics DSH Chan, YY Liu, JCH Phang, E Rau, R Sennov, AV Gostev Review of scientific instruments 75 (10), 3191-3199, 2004 | 4 | 2004 |
Stereomicrotomography as a new method of scanning electron microscopy investigation of three-dimensional microstructures SA Ditsman, EI Rau, RA Sennov, VN Sokolov, DI Yurkovets, VN Melnik Surface Investigation: X-Ray, Synchrotron and Neutron Techniques 16 (12 …, 2001 | 4 | 2001 |
Increasing spatial resolution in the backscattered electron mode of scanning electron microscopy NA Koshev, FA Luk’yanov, EI Rau, RA Sennov, AG Yagola Bulletin of the Russian Academy of Sciences: Physics 75, 1181-1184, 2011 | 3 | 2011 |
Method and instrumentation microtomography in scanning electron microscopy AV Gostev, SA Ditsman, FA Luk’janov, NA Orlikovskij, EI Rau, RA Sennov Instruments and Experimental Techniques 4, 124-134, 2010 | 3 | 2010 |
Heteroepitaxial III–V films on fianite substrates and buffer layers YN Buzynin, MN Drozdov, AN Buzynin, VV Osiko, BN Zvonkov, ... Bulletin of the Russian Academy of Sciences: Physics 73, 485-490, 2009 | 2 | 2009 |
Some kinetic aspects of the charging of dielectric targets by a (1–50)-keV electron beam EN Evstaf’eva, EI Rau, RA Sennov Bulletin of the Russian Academy of Sciences: Physics 72 (11), 1493-1498, 2008 | 2 | 2008 |
Determination of average energy of electrons, backscattered with homogeneous, layered and insulator targets EI Rau, RA Sennov Izvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya 68 …, 2004 | 2 | 2004 |
Energy spectra of electrons backscattered from bulk solid targets AV Bolotina, FA Luk’yanov, EI Rau, RA Sennov, AG Yagola Moscow University Physics Bulletin 64, 503-506, 2009 | 1 | 2009 |
Estimates of Local Film Thicknesses in Multilayer Structures by Spectra of Backscattered Electrons in SEM EI Rau, RA Sennov, LR Reimer, H Hoffmeister BULLETIN-RUSSIAN ACADEMY OF SCIENCES PHYSICS C/C OF IZVESTIIA-ROSSIISKAIA …, 2001 | 1 | 2001 |
Investigation of electron-optical characteristics of a toroidal spectrometer; Issledovanie ehlektronno-opticheskikh kharakteristik toroidal'nogo spektrometra EI Ray, VO Savin, BG Sennov, BG Frejnkman, K Khofmajster Izvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya 64, 2000 | 1 | 2000 |