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Minxu Peng
Minxu Peng
PhD Candidate, Department of Electrical and Computer Engineering, Boston University
Verified email at bu.edu
Title
Cited by
Cited by
Year
Source shot noise mitigation in focused ion beam microscopy by time-resolved measurement
M Peng, J Murray-Bruce, KK Berggren, VK Goyal
Ultramicroscopy 211, 112948, 2020
262020
Time-resolved focused ion beam microscopy: modeling, estimation methods, and analyses
M Peng, J Murray-Bruce, VK Goyal
IEEE Transactions on Computational Imaging 7, 547-561, 2021
142021
Online Beam Current Estimation in Particle Beam Microscopy
SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal
IEEE Transactions on Computational Imaging 8, 521-535, 2022
52022
Convolutional Neural Network Denoising of Focused Ion Beam Micrographs
M Peng, M Cokbas, UD Gallastegi, P Ishwar, J Konrad, B Kulis, VK Goyal
2021 IEEE 31st International Workshop on Machine Learning for Signal …, 2021
42021
Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy
L Watkins, SW Seidel, M Peng, A Agarwal, CY Christopher, VK Goyal
2021 IEEE International Conference on Image Processing (ICIP), 3487-3491, 2021
42021
Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing
L Watkins, S Seidel, M Peng, A Agarwal, C Yu, V Goyal
Microscopy and Microanalysis 27 (S1), 422-425, 2021
42021
Denoising particle beam micrographs with plug-and-play methods
M Peng, R Kitichotkul, SW Seidel, C Yu, VK Goyal
IEEE Transactions on Computational Imaging, 2023
22023
Continuous-time modeling and analysis of particle beam metrology
A Agarwal, M Peng, VK Goyal
IEEE Journal on Selected Areas in Information Theory, 2023
22023
Addressing Neon Gas Field Ion Source Instability Through Online Beam Current Estimation
SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal
Microscopy and Microanalysis 28 (S1), 36-39, 2022
22022
Source shot noise mitigation in scanned beam microscopy
M. Peng, J. Murray-Bruce, K. K. Berggren, V. K. Goyal
Proc. 62nd Int. Conf. Electron, Ion, Photon Beam Technologies and …, 2018
1*2018
Denoising Particle Beam Micrographs with Plug-and-Play ADMM
M Peng, SW Seidel, C Yu, VK Goyal
arXiv preprint arXiv:2208.14256, 2022
2022
Online Beam Current Estimation in Particle Beam Microscopy Through Time-Resolved Measurement
SW Seidel, L Watkins, M Peng, A Agarwal, CC Yu, VK Goyal
Proc. 65th Int. Conf. Electron, Ion, Photon Beam Technologies and …, 2022
2022
Source Shot Noise Mitigation in Helium Ion and Focused Ion Beam Microscopy
M. Peng, J. Murray-Bruce, K. K. Berggren, V. K. Goyal
In Proc. 2nd Int. Conf. on Helium and emerging Focused Ion Beams, Dresden …, 2018
2018
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