An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements T Dargent, K Haddadi, T Lasri, N Clément, D Ducatteau, B Legrand, ... Review of Scientific Instruments 84 (12), 2013 | 75 | 2013 |
Formulation for complete and accurate calibration of six-port reflectometer K Haddadi, T Lasri IEEE Transactions on Microwave Theory and Techniques 60 (3), 574-581, 2012 | 64 | 2012 |
Measurement techniques for RF nanoelectronic devices: new equipment to overcome the problems of impedance and scale mismatch H Happy, K Haddadi, D Theron, T Lasri, G Dambrine IEEE Microwave Magazine 15 (1), 30-39, 2014 | 56 | 2014 |
A 60 GHz scanning near-field microscope with high spatial resolution sub-surface imaging K Haddadi, D Glay, T Lasri IEEE microwave and wireless components letters 21 (11), 625-627, 2011 | 49 | 2011 |
Contactless microwave technique based on a spread-loss model for dielectric materials characterization K Haddadi, MM Wang, O Benzaim, D Glay, T Lasri IEEE Microwave and Wireless Components Letters 19 (1), 33-35, 2008 | 45 | 2008 |
A 60 GHz six-port distance measurement system with sub-millimeter accuracy K Haddadi, MM Wang, D Glay, T Lasri IEEE microwave and wireless components letters 19 (10), 644-646, 2009 | 42 | 2009 |
Electromagnetically induced absorption in detuned stub waveguides: a simple analytical and experimental model A Mouadili, EH El Boudouti, A Soltani, A Talbi, B Djafari-Rouhani, ... Journal of Physics: Condensed Matter 26 (50), 505901, 2014 | 40 | 2014 |
Four-port communication receiver with digital IQ-regeneration K Haddadi, MM Wang, C Loyez, D Glay, T Lasri IEEE microwave and wireless components letters 20 (1), 58-60, 2009 | 39 | 2009 |
Interferometric technique for scanning near-field microwave microscopy applications H Bakli, K Haddadi, T Lasri IEEE Transactions on Instrumentation and Measurement 63 (5), 1281-1286, 2014 | 38 | 2014 |
Geometrical optics-based model for dielectric constant and loss tangent free-space measurement K Haddadi, T Lasri IEEE Transactions on Instrumentation and Measurement 63 (7), 1818-1823, 2014 | 37 | 2014 |
Development of multifrequency-swept microwave sensing system for moisture measurement of sweet corn with deep neural network J Zhang, D Du, Y Bao, J Wang, Z Wei IEEE Transactions on Instrumentation and Measurement 69 (9), 6446-6454, 2020 | 32 | 2020 |
Interferometric technique for microwave measurement of high impedances K Haddadi, T Lasri 2012 IEEE/MTT-S International Microwave Symposium Digest, 1-3, 2012 | 29 | 2012 |
Microwave liquid sensing based on interferometry and microscopy techniques K Haddadi, H Bakli, T Lasri IEEE microwave and wireless components letters 22 (10), 542-544, 2012 | 28 | 2012 |
60-GHz near-field six-port microscope using a scanning slit probe for subsurface sensing K Haddadi, T Lasri IEEE Sensors Journal 12 (8), 2575-2576, 2012 | 28 | 2012 |
Calibration and performance of two new ultra-wideband four-port-based systems K Haddadi, MM Wang, K Nouri, D Glay, T Lasri IEEE Transactions on Microwave Theory and Techniques 56 (12), 3137-3142, 2008 | 28 | 2008 |
Performance of a compact dual six-port millimeter-wave network analyzer K Haddadi, MM Wang, D Glay, T Lasri IEEE Transactions on Instrumentation and Measurement 60 (9), 3207-3213, 2011 | 25 | 2011 |
Wide-band 0.9 GHz to 4 GHz four-port receiver K Haddadi, H El Aabbaoui, C Loyez, D Glay, N Rolland, T Lasri 2006 13th IEEE International Conference on Electronics, Circuits and Systems …, 2006 | 24 | 2006 |
A fully InP monolithic integrated millimeter-wave reflectometer K Haddadi, H El Aabbaoui, B Gorisse, D Glay, N Rolland, T Lasri 2006 European Microwave Conference, 703-706, 2006 | 22 | 2006 |
Setting parameters influence on accuracy and stability of near-field scanning microwave microscopy platform S Gu, K Haddadi, A El Fellahi, T Lasri IEEE Transactions on Instrumentation and Measurement 65 (4), 890-897, 2016 | 21 | 2016 |
Sensing of liquid droplets with a scanning near-field microwave microscope K Haddadi, S Gu, T Lasri Sensors and Actuators A: Physical 230, 170-174, 2015 | 21 | 2015 |