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Todd Bailey
Todd Bailey
Deputy Director, GLOBALFOUNDRIES
Verified email at utexas.edu
Title
Cited by
Cited by
Year
Step and flash imprint lithography: a new approach to high-resolution patterning
M Colburn, SC Johnson, MD Stewart, S Damle, TC Bailey, B Choi, ...
Emerging Lithographic Technologies III 3676, 379-389, 1999
10601999
Step and flash imprint lithography: Template surface treatment and defect analysis
T Bailey, BJ Choi, M Colburn, M Meissl, S Shaya, JG Ekerdt, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
5132000
Template for room temperature, low pressure micro-and nano-imprint lithography
T Bailey, BJ Choi, M Colburn, SV Sreenivasan, CG Willson, J Ekerdt
US Patent 6,696,220, 2004
4222004
Patterning curved surfaces: Template generation by ion beam proximity lithography and relief transfer by step and flash imprint lithography
P Ruchhoeft, M Colburn, B Choi, H Nounu, S Johnson, T Bailey, S Damle, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
2121999
Imprint lithography for integrated circuit fabrication
DJ Resnick, WJ Dauksher, D Mancini, KJ Nordquist, TC Bailey, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
1822003
Development and advantages of step-and-flash lithography
M Colburn, T Bailey, BJ Choi, JG Ekerdt, SV Sreenivasan, CG Willson
Solid State Technology 44 (7), 67-80, 2001
1702001
Step and flash imprint lithography for sub-100-nm patterning
M Colburn, A Grot, MN Amistoso, BJ Choi, TC Bailey, JG Ekerdt, ...
Emerging Lithographic Technologies IV 3997, 453-457, 2000
1702000
High-resolution overlay alignment methods for imprint lithography
SV Sreenivasan, BJ Choi, M Colburn, T Bailey
US Patent 6,921,615, 2005
1602005
Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography
BJ Choi, M Colburn, SV Sreenivasan, CG Willson, T Bailey, J Ekerdt
US Patent 6,954,275, 2005
1542005
High resolution templates for step and flash imprint lithography
DJ Resnick, WJ Dauksher, DP Mancini, KJ Nordquist, ES Ainley, ...
Journal of Micro/Nanolithography, MEMS, and MOEMS 1 (3), 284-289, 2002
1432002
Method and system of automatic fluid dispensing for imprint lithography processes
B Choi, S Sreenivasan, C Willson, M Colburn, T Bailey, J Ekerdt
US Patent App. 09/908,455, 2002
1272002
Method of varying template dimensions to achieve alignment during imprint lithography
SV Sreenivasan, BJ Choi, M Colburn, T Bailey
US Patent 6,916,585, 2005
1212005
Characterization and modeling of volumetric and mechanical properties for step and flash imprint lithography photopolymers
M Colburn, I Suez, BJ Choi, M Meissl, T Bailey, SV Sreenivasan, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
1072001
Imprint lithography template comprising alignment marks
SV Sreenivasan, BJ Choi, M Colburn, T Bailey
US Patent 6,842,229, 2005
1012005
Template fabrication schemes for step and flash imprint lithography
TC Bailey, DJ Resnick, D Mancini, KJ Nordquist, WJ Dauksher, E Ainley, ...
Microelectronic engineering 61, 461-467, 2002
982002
Patterning nonflat substrates with a low pressure, room temperature, imprint lithography process
M Colburn, A Grot, BJ Choi, M Amistoso, T Bailey, SV Sreenivasan, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
882001
Imprint lithography template having a feature size under 250 nm
TC Bailey, BJ Choi, ME Colburn, SV Sreenivasan, CG Willson, JG Ekerdt
US Patent 7,229,273, 2007
872007
Imprint lithography templates having alignment marks
T Bailey, S Johnson, M Colburn, BJ Choi, B Smith, J Ekerdt, C Willson, ...
US Patent App. 10/666,527, 2005
842005
Step and flash imprint lithography: Defect analysis
T Bailey, B Smith, BJ Choi, M Colburn, M Meissl, SV Sreenivasan, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
812001
Hydrogen silsesquioxane for direct electron-beam patterning of step and flash imprint lithography templates
DP Mancini, KA Gehoski, E Ainley, KJ Nordquist, DJ Resnick, TC Bailey, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002
792002
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