Effect of annealing on electrical resistivity of rf-magnetron sputtered nanostructured SnO2 thin films AF Khan, M Mehmood, AM Rana, MT Bhatti Applied Surface Science 255 (20), 8562-8565, 2009 | 87 | 2009 |
Characterization of rf-sputtered indium tin oxide thin films MT Bhatti, AM Rana, AF Khan Materials chemistry and physics 84 (1), 126-130, 2004 | 63 | 2004 |
Forming-free bipolar resistive switching in nonstoichiometric ceria films M Ismail, CY Huang, D Panda, CJ Hung, TL Tsai, JH Jieng, CA Lin, ... Nanoscale research letters 9 (1), 45, 2014 | 60 | 2014 |
Effect of annealing on structural, optical and electrical properties of nanostructured Ge thin films AF Khan, M Mehmood, AM Rana, T Muhammad Applied Surface Science 256 (7), 2031-2037, 2010 | 48 | 2010 |
Improved endurance and resistive switching stability in ceria thin films due to charge transfer ability of Al dopant M Ismail, E Ahmed, AM Rana, F Hussain, I Talib, MY Nadeem, D Panda, ... ACS applied materials & interfaces 8 (9), 6127-6136, 2016 | 37 | 2016 |
Optical characterization of rf-magnetron sputtered nanostructured SnO2 thin films AF Khan, M Mehmood, AM Rana, MT Bhatti, A Mahmood Chinese Physics Letters 26 (7), 077803, 2009 | 30 | 2009 |
Coexistence of bipolar and unipolar resistive switching in Al-doped ceria thin films for non-volatile memory applications M Ismail, E Ahmed, AM Rana, I Talib, MY Nadeem Journal of Alloys and Compounds 646, 662-668, 2015 | 27 | 2015 |
Endurance and Cycle-to-cycle Uniformity Improvement in Tri-Layered CeO2/Ti/CeO2 Resistive Switching Devices by Changing Top Electrode Material AM Rana, T Akbar, M Ismail, E Ahmad, F Hussain, I Talib, M Imran, ... Scientific reports 7, 39539, 2017 | 24 | 2017 |
Performance stability and functional reliability in bipolar resistive switching of bilayer ceria based resistive random access memory devices M Ismail, I Talib, AM Rana, E Ahmed, MY Nadeem Journal of Applied Physics 117 (8), 084502, 2015 | 20 | 2015 |
Room-temperature fabricated, fully transparent resistive memory based on ITO/CeO2/ITO structure for RRAM applications M Ismail, AM Rana, I Talib, TL Tsai, U Chand, E Ahmed, MY Nadeem, ... Solid State Communications 202, 28-34, 2015 | 19 | 2015 |
Characterization of e-beam evaporated hafnium oxide thin films on post thermal annealing M Ramzan, MF Wasiq, AM Rana, S Ali, MY Nadeem Applied Surface Science 283, 617-622, 2013 | 19 | 2013 |
The optical absorption study of cadmium-zinc phosphate glasses MA Chaudhry, MS Bilal, M Altaf, A Ahmed, AM Rana Journal of materials science letters 14 (14), 975-977, 1995 | 17 | 1995 |
Effect of annealing on electrical properties of Indium Tin Oxide (ITO) thin films MT Bhatti, AM Rana, AF Khan, MI Ansari J Appl Sci 2, 570-3, 2002 | 15 | 2002 |
Optical characterization of hafnium oxide thin films for heat mirrors M Ramzan, AM Rana, E Ahmed, MF Wasiq, AS Bhatti, M Hafeez, A Ali, ... Materials Science in Semiconductor Processing 32, 22-30, 2015 | 14 | 2015 |
Characterization of phenanthrene single crystals MT Bhatti, AM Rana, M Ali, GN Shahid, M Saleh Turkish Journal of Physics 24 (5), 673-679, 2000 | 14 | 2000 |
Impact of work function on the resistive switching characteristics of M/ZnO/CeO2/Pt devices S Jabeen, M Ismail, AM Rana, E Ahmed Materials Research Express 4 (5), 056401, 2017 | 13 | 2017 |
Role of tantalum nitride as active top electrode in electroforming-free bipolar resistive switching behavior of cerium oxide-based memory cells M Ismail, E Ahmed, AM Rana, I Talib, T Khan, K Iqbal, MY Nadeem Thin Solid Films 583, 95-101, 2015 | 13 | 2015 |
Resistive switching characteristics of Pt/CeOx/TiN memory device M Ismail, I Talib, CY Huang, CJ Hung, TL Tsai, JH Jieng, U Chand, CA Lin, ... Japanese Journal of Applied Physics 53 (6), 060303, 2014 | 13 | 2014 |
Optical characteristics of some binary and ternary phosphate glasses MA Chaudhry, AM Rana, M Altaf, MS Bilal Australian Journal of Physics 48 (5), 887-892, 1995 | 13 | 1995 |
AFM applications to study the morphology of HfO2 multilayer thin films M Ramzan, E Ahmed, NA Niaz, AM Rana, AS Bhatti, NR Khalid, ... Superlattices and Microstructures 82, 399-405, 2015 | 12 | 2015 |