| Bio-inspired imprecise computational blocks for efficient VLSI implementation of soft-computing applications HR Mahdiani, A Ahmadi, SM Fakhraie, C Lucas IEEE Transactions on Circuits and Systems I: Regular Papers 57 (4), 850-862, 2009 | 718 | 2009 |
| Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs A Ahmadi, A Nahar, B Orr, M Past, Y Makris 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 74 | 2016 |
| A rapid and simple ratiometric fluorescent sensor for patulin detection based on a stabilized DNA duplex probe containing less amount of aptamer-involved base pairs A Ahmadi, NM Danesh, M Ramezani, M Alibolandi, P Lavaee, AS Emrani, ... Talanta 204, 641-646, 2019 | 42 | 2019 |
| Brain-computer interface signal processing algorithms: A computational cost vs. accuracy analysis for wearable computers A Ahmadi, O Dehzangi, R Jafari 2012 Ninth International Conference on Wearable and Implantable Body Sensor …, 2012 | 28 | 2012 |
| A low-cost fault-tolerant approach for hardware implementation of artificial neural networks A Ahmadi, MH Sargolzaie, SM Fakhraie, C Lucas, S Vakili 2009 International Conference on Computer Engineering and Technology 2, 93-97, 2009 | 20 | 2009 |
| Workload characterization and prediction: A pathway to reliable multi-core systems M Zaman, A Ahmadi, Y Makris 2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 116-121, 2015 | 19 | 2015 |
| Light-weight single trial EEG signal processing algorithms: computational profiling for low power design A Ahmadi, R Jafari, J Hart 2011 Annual international conference of the IEEE engineering in medicine and …, 2011 | 18 | 2011 |
| Yield forecasting in Fab-to-Fab production migration based on Bayesian model fusion A Ahmadi, HG Stratigopoulos, A Nahar, B Orr, M Pas, Y Makris 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 9-14, 2015 | 16 | 2015 |
| Yield forecasting across semiconductor fabrication plants and design generations A Ahmadi, HG Stratigopoulos, K Huang, A Nahar, B Orr, M Pas, JM Carulli, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 15 | 2017 |
| A machine learning approach to fab-of-origin attestation A Ahmadi, MM Bidmeshki, A Nahar, B Orr, M Pas, Y Makris 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-6, 2016 | 12 | 2016 |
| Wafer-level adaptive trim seed forecasting based on E-tests C Xanthopoulos, A Ahmadi, S Boddikurapati, A Nahar, B Orr, Y Makris 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017 | 10 | 2017 |
| Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation A Ahmadi, K Huang, S Natarajan, JM Carulli, Y Makris 2014 International Test Conference, 1-10, 2014 | 10 | 2014 |
| Harnessing process variations for optimizing wafer-level probe-test flow A Ahmadi, C Xanthopoulos, A Nahar, B Orr, M Pas, Y Makris 2016 IEEE International Test Conference (ITC), 1-8, 2016 | 8 | 2016 |
| Yield prognosis for Fab-to-Fab product migration A Ahmadi, K Huang, A Nahar, B Orr, M Pas, JM Carulli, Y Makris 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015 | 8 | 2015 |
| Behavioral fault model for neural networks A Ahmadi, SM Fakhraie, C Lucas 2009 International Conference on Computer Engineering and Technology 2, 71-75, 2009 | 6 | 2009 |
| The Effects of Urban Tourism on the Quality of Life of Citizens (Case Study: Yasouj of City) A Ghanbari, E Derakhshan, SM Salehi, A Ahmadi Journal of Tourism and Development 6 (1), 23-44, 2017 | 5 | 2017 |
| Harnessing fabrication process signature for predicting yield across designs A Ahmadi, HG Stratigopoulos, A Nahar, B Orr, M Pas, Y Makris 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 898-901, 2016 | 5 | 2016 |
| Design flow for hardware implementation of digital filters R Yousefi, A Ahmadi, SM Fakhraie 2008 International Symposium on Telecommunications, 586-591, 2008 | 5 | 2008 |
| − 197dBc/Hz FOM 4.3-GHz VCO Using an addressable array of minimum-sized nmos cross-coupled transistor pairs in 65-nm CMOS A Jha, A Ahmadi, S Kshattry, T Cao, K Liao, G Yeap, Y Makris, O KK 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits), 1-2, 2016 | 4 | 2016 |
| Gaussian process-based wafer-level correlation modeling and its applications C Xanthopoulos, K Huang, A Ahmadi, N Kupp, J Carulli, A Nahar, B Orr, ... Machine Learning in VLSI Computer-Aided Design, 119-173, 2019 | 3 | 2019 |
