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Eyad H. AbedProfessor of Electrical and Computer Engineering, University of Maryland, College ParkVerified email at umd.edu
Abdella BattouNISTVerified email at nist.gov
Tao ZhangNational Institute of Standards and Technology (NIST)Verified email at ieee.org
Suchin ArunsawatwongDepartment of Electrical Engineering, Faculty of Engineering, Chulalongkorn UniversityVerified email at chula.ac.th
Ran XinResearch Scientist, ByteDanceVerified email at bytedance.com
Usman A. KhanProfessor, ECE and CS, Tufts University, Amazon Scholar at Amazon RoboticsVerified email at ece.tufts.edu
Chenguang XiMachine Learning Engineer, ByteDanceVerified email at bytedance.com
Siqi FanTexas A&M UniversityVerified email at tamu.edu
I-Hong HouTexas A&M UniversityVerified email at tamu.edu
Dipankar MaityUniversity of North Carolina at CharlotteVerified email at charlotte.edu
Stratis IoannidisNortheastern UniversityVerified email at neu.edu
Davide PesaventoNational Institute of Standards and Technology (NIST)Verified email at nist.gov
Bhaskar RamasubramanianWestern Washington UniversityVerified email at wwu.edu
Michael C. RotkowitzAsst. Professor, Department of Electrical and Computer Engineering, The University of MarylandVerified email at umd.edu
Beichuan ZhangProfessor of Computer Science, the University of ArizonaVerified email at cs.arizona.edu
Klaus SchneiderUniversity of ArizonaVerified email at cs.arizona.edu
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Van Sy Mai
National Institute of Standards and Technology (NIST), and IZUM Inc.
Verified email at nist.gov