| Why lead methylammonium tri-iodide perovskite-based solar cells require a mesoporous electron transporting scaffold (but not necessarily a hole conductor) E Edri, S Kirmayer, A Henning, S Mukhopadhyay, K Gartsman, ... Nano letters 14 (2), 1000-1004, 2014 | 662 | 2014 |
| Hot-carrier cooling in GaAs: Quantum wells versus bulk Y Rosenwaks, MC Hanna, DH Levi, DM Szmyd, RK Ahrenkiel, AJ Nozik Physical Review B 48 (19), 14675, 1993 | 308 | 1993 |
| Kelvin probe force microscopy of semiconductor surface defects Y Rosenwaks, R Shikler, T Glatzel, S Sadewasser Physical Review B 70 (8), 085320, 2004 | 248 | 2004 |
| Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution O Tal, Y Rosenwaks, Y Preezant, N Tessler, CK Chan, A Kahn Physical review letters 95 (25), 256405, 2005 | 209 | 2005 |
| Molecular control over semiconductor surface electronic properties: Dicarboxylic acids on CdTe, CdSe, GaAs, and InP R Cohen, L Kronik, A Shanzer, D Cahen, A Liu, Y Rosenwaks, JK Lorenz, ... Journal of the American Chemical Society 121 (45), 10545-10553, 1999 | 207 | 1999 |
| Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy G Rosenman, P Urenski, A Agronin, Y Rosenwaks, M Molotskii Applied Physics Letters 82 (1), 103-105, 2003 | 195 | 2003 |
| Yellow luminescence and related deep levels in unintentionally doped GaN films I Shalish, L Kronik, G Segal, Y Rosenwaks, Y Shapira, U Tisch, J Salzman Physical Review B 59 (15), 9748, 1999 | 191 | 1999 |
| Ferroelectric domain breakdown M Molotskii, A Agronin, P Urenski, M Shvebelman, G Rosenman, ... Physical review letters 90 (10), 107601, 2003 | 174 | 2003 |
| Measurement of active dopant distribution and diffusion in individual silicon nanowires E Koren, N Berkovitch, Y Rosenwaks Nano letters 10 (4), 1163-1167, 2010 | 170 | 2010 |
| Fabrication of a photoelectronic device by direct chemical binding of the photosynthetic reaction center protein to metal surfaces L Frolov, Y Rosenwaks, C Carmeli, I Carmeli Advanced Materials 17 (20), 2434-2437, 2005 | 142 | 2005 |
| The electronic structure of metal oxide/organo metal halide perovskite junctions in perovskite based solar cells A Dymshits, A Henning, G Segev, Y Rosenwaks, L Etgar Scientific reports 5 (1), 8704, 2015 | 120 | 2015 |
| Dynamics of ferroelectric domain growth in the field of atomic force microscope A Agronin, M Molotskii, Y Rosenwaks, G Rosenman, BJ Rodriguez, ... Journal of Applied Physics 99 (10), 2006 | 119 | 2006 |
| Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy E Koren, Y Rosenwaks, JE Allen, ER Hemesath, LJ Lauhon Applied Physics Letters 95 (9), 2009 | 116 | 2009 |
| Reconstruction of electrostatic force microscopy images E Strassburg, A Boag, Y Rosenwaks Review of Scientific instruments 76 (8), 2005 | 115 | 2005 |
| Obtaining uniform dopant distributions in VLS-grown Si nanowires E Koren, JK Hyun, U Givan, ER Hemesath, LJ Lauhon, Y Rosenwaks Nano letters 11 (1), 183-187, 2011 | 112 | 2011 |
| Potential imaging of operating light-emitting devices using Kelvin force microscopy R Shikler, T Meoded, N Fried, Y Rosenwaks Applied physics letters 74 (20), 2972-2974, 1999 | 108 | 1999 |
| Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function T Glatzel, S Sadewasser, R Shikler, Y Rosenwaks, MC Lux-Steiner Materials Science and Engineering: B 102 (1-3), 138-142, 2003 | 107 | 2003 |
| Picosecond time-resolved luminescence studies of surface and bulk recombination processes in InP Y Rosenwaks, Y Shapira, D Huppert Physical Review B 45 (16), 9108, 1992 | 99 | 1992 |
| Fermi level pinning by gap states in organic semiconductors S Yogev, R Matsubara, M Nakamura, U Zschieschang, H Klauk, ... Physical Review Letters 110 (3), 036803, 2013 | 98 | 2013 |
| Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation S Sadewasser, T Glatzel, R Shikler, Y Rosenwaks, MC Lux-Steiner Applied Surface Science 210 (1-2), 32-36, 2003 | 95 | 2003 |
Gil RosenmanProfessor of Electrical Engineering, Tel Aviv UniversityVerified email at eng.tau.ac.il
