Continuous flow in open microfluidics using controlled evaporation M Zimmermann, S Bentley, H Schmid, P Hunziker, E Delamarche Lab on a Chip 5 (12), 1355-1359, 2005 | 109 | 2005 |
Methods of forming vertical transistor devices with self-aligned top source/drain conductive contacts JH Zhang, C Radens, SJ Bentley, BA Cohen, KY Lim US Patent 9,530,866, 2016 | 93 | 2016 |
Methods of forming nanosheet transistor with dielectric isolation of source-drain regions and related structure J Frougier, MG Sung, R Xie, C Park, S Bentley US Patent 9,947,804, 2018 | 76 | 2018 |
Methods of forming replacement gate structures and bottom and top source/drain regions on a vertical transistor device SJ Bentley, JH Zhang, KY Lim, H Niimi US Patent 9,640,636, 2017 | 62 | 2017 |
Self-aligned gate-first VFETs using a gate spacer recess JH Zhang, KY Lim, SJ Bentley, C Park US Patent 9,536,793, 2017 | 59 | 2017 |
Devices and methods of forming VFET with self-aligned replacement metal gates aligned to top spacer post top source drain EPI J Zhang, S Bentley, KY Lim US Patent 9,773,708, 2017 | 55 | 2017 |
Methods of forming vertical transistor devices with self-aligned replacement gate structures JH Zhang, C Radens, SJ Bentley, BA Cohen, KY Lim US Patent 9,530,863, 2016 | 50 | 2016 |
Complementary FETs with wrap around contacts and method of forming same J Frougier, R Xie, PH Suvarna, H Niimi, SJ Bentley, A Razavieh US Patent 10,192,867, 2019 | 49 | 2019 |
Electron Mobility in Surface- and Buried-Channel FlatbandMOSFETs With ALDGate Dielectric SJ Bentley, M Holland, X Li, GW Paterson, H Zhou, O Ignatova, ... IEEE Electron Device Letters 32 (4), 494-496, 2011 | 48 | 2011 |
Methods of forming fins for a FinFET semiconductor device using a mandrel oxidation process BJ Pawlak, S Bentley, A Jacob US Patent 8,716,156, 2014 | 44 | 2014 |
Methods of forming substrates comprised of different semiconductor materials and the resulting device BJ Pawlak, S Bentley, A Jacob US Patent 9,368,578, 2016 | 42 | 2016 |
Methods of forming a nano-sheet transistor device with a thicker gate stack and the resulting device J Frougier, A Razavieh, R Xie, S Bentley US Patent 9,991,352, 2018 | 41 | 2018 |
Method and structure to control channel length in vertical FET device S Bentley, R Xie US Patent 9,972,494, 2018 | 37 | 2018 |
Work function metal patterning for NP space between active nanostructures D Chanemougame, SR Soss, SJ Bentley, J Frougier, R Xie US Patent 10,510,620, 2019 | 36 | 2019 |
Methods of forming a gate structure on a vertical transistor device JH Zhang, SJ Bentley, KY Lim US Patent 9,799,751, 2017 | 33 | 2017 |
Surface passivation of AlN/GaN MOS-HEMTs using ultra-thin Al2O3 formed by thermal oxidation of evaporated aluminium S Taking, A Banerjee, H Zhou, X Li, AZ Khokhar, R Oxland, I McGregor, ... Electronics letters 46 (4), 301-302, 2010 | 31 | 2010 |
Methods of forming epitaxial semiconductor material on source/drain regions of a finfet semiconductor device and the resulting devices JA Fronheiser, BV Krishnan, MK Akarvardar, S Bentley, AP Jacob, J Liu US Patent App. 14/164,934, 2015 | 29 | 2015 |
Method, apparatus, and system for fin-over-nanosheet complementary field-effect-transistor R Xie, S Soss, S Bentley, D Chanemougame, J Frougier, P Bipul, ... US Patent 11,201,152, 2021 | 26 | 2021 |
Metal layer routing level for vertical FET SRAM and logic cell scaling S Bentley, BC Paul US Patent 9,825,032, 2017 | 26 | 2017 |
Self-aligned dual-height isolation for bulk FinFET MK Akarvardar, SJ Bentley, K Cheng, BB Doris, J Fronheiser, AP Jacob, ... US Patent 9,324,790, 2016 | 24 | 2016 |