Didem Erol As
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An automated setup for the characterization of time-based degradation effects including the process variability in 40-nm CMOS transistors
X Xhafa, AD Güngördü, D Erol, Y Yavuz, MB Yelten
IEEE Transactions on Instrumentation and Measurement 70, 1-10, 2021
A switchable DC offset cancellation circuit for time-based degradation correction
D Erol, AD Güngördü, G Dündar, MB Yelten
Analog Integrated Circuits and Signal Processing 106, 485-491, 2021
An Offset Cancellation Set-up for Amplifiers Subject to Aging
D Erol, AD Güngördü, G Dündar, MB Yelten
2019 11th International Conference on Electrical and Electronics Engineering …, 2019
A highly-linear, sub-mW LNA at 2.4 GHz in 40 nm CMOS process
D Erol As, MB Yelten
A Phase Error Correction Algorithm for RF Energy Harvesters Using Two Antennas
AD Guengoerdue, D Erol, A Caglar, MB Yelten
SMACD/PRIME 2021; International Conference on SMACD and 16th Conference on …, 2021
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