Lee Barford

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Citations	1217	285
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Nicholas TufillaroTuataraVerified email at aquahue.net
Frederick C Harris, Jr.Professor of Computer Science and Engineering, University of NevadaVerified email at cse.unr.edu
Dominique SchreursProf. in EE, KU LeuvenVerified email at kuleuven.be
Gautam BiswasCornelius Vanderbilt Professor of Engineering; Professor of Computer Science and EngineeringVerified email at vanderbilt.edu
David E. RootKeysight TechnologiesVerified email at keysight.com
Pieter J. MostermanMathWorksVerified email at mathworks.com
Shuvra S. BhattacharyyaProfessor of Electrical and Computer Engineering, University of MarylandVerified email at umd.edu
Yanzhou LiuGoogleVerified email at umd.edu
Rui WuAssistant Professor, Department of Computer Science, East Carolina UniversityVerified email at ecu.edu
Kurt BarbeProfessor at the Vrije Universiteit BrusselVerified email at vub.ac.be
Sergiu DascaluProfessor, Computer Science and Engineering, University of Nevada RenoVerified email at cse.unr.edu
Sergio RapuanoProfessor, University of Sannio, Benevento, ItalyVerified email at unisannio.it
Tom VandeplasKeysight TechnologiesVerified email at keysight.com
Dr. Lieve Lauwerspostdoctoral researcherVerified email at vub.ac.be
Michael J. McGuffinÉcole de technologie supérieureVerified email at etsmtl.ca
Robert UhlRWTH AachenVerified email at rwth-aachen.de
Antonello MontiRWTH Aachen UniversityVerified email at eonerc.rwth-aachen.de
Markus MirzRWTH Aachen UniversityVerified email at rwth-aachen.de
Luca De VitoDipartimento di Ingegneria, Università degli Studi del SannioVerified email at unisannio.it
Ioan TudosaUniversity of Sannio, IEEE Senior MemberVerified email at unisannio.it

Lee Barford

Fellow, Keysight Technologies

Verified email at keysight.com

Software/gateware for quantum computing parallel algorithms signal processing automatic diagnosis


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Method and apparatus for using parameters to simulate an electronic circuit LA Barford, NH Chang, B Troyanovsky US Patent 5,946,482, 1999	58	1999
Model-based diagnostic system with automated procedures for next test selection V Kanevsky, LA Barford US Patent 6,167,352, 2000	57	2000
An introduction to wavelets LA Barford, RS Fazzio, DR Smith Hewlett Packard, 1992	55	1992
Method and apparatus for extraction of nonlinear black-box behavioral models from embeddings of the time-domain measurements LA Barford, LA Kamas, NB Tufillaro, DA Usikov US Patent 6,850,871, 2005	54	2005
Revising a test suite using diagnostic efficacy evaluation LA Barford US Patent 7,139,676, 2006	51	2006
Method of controlling a device and a device controlled thereby LA Barford, SA Newton US Patent App. 11/933,189, 2009	47	2009
Method of computer-aided prediction of collisions between objects including fabrication tools and parts to be fabricated SA Conradson, LA Barford US Patent 5,307,282, 1994	44	1994
Apparatus and method for computer-aided design of sheet metal fabricated parts SA Conradson, LA Barford, WD Fisher, MJ Weinstein, JD Wilker US Patent 5,587,914, 1996	42	1996
An approach for fault detection and isolation in dynamic systems from distributed measurements EJ Manders, LA Barford, G Biswas IEEE Transactions on instrumentation and Measurement 51 (2), 235-240, 2002	40	2002
A GRAPHICAL, LANGUAGE-BASED EDITOR FOR GENERIC SOLID MODELS REPRESENTED BY CONSTRAINTS (CAD) LA Barford Cornell University, 1987	40	1987
Construction of behavioral models for microwave devices from time domain large‐signal measurements to speed up high‐level design simulations D Schreurs, J Wood, N Tufillaro, L Barford, DE Root International Journal of RF and Microwave Computer‐Aided Engineering: Co …, 2003	38	2003
Signal interpretation for monitoring and diagnosis, a cooling system testbed EJ Manders, G Biswas, PJ Mosterman, LA Barford, RJ Barnett IEEE Transactions on Instrumentation and Measurement 49 (3), 503-508, 2000	37	2000
Probabilistic diagnosis, in particular for embedded and remote applications LA Barford, DR Smith US Patent 6,691,249, 2004	32	2004
The construction and evaluation of behavioral models for microwave devices based on time-domain large-signal measurements D Schreurs, J Wood, N Tufillaro, D Usikov, L Barford, DE Root International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No …, 2000	29	2000
Attribute grammars in constraint‐based graphics systems LA Barford, BT Vander Zanden Software: Practice and Experience 19 (4), 309-328, 1989	26	1989
System model determination for failure detection and isolation, in particular in computer systems LA Barford, C Zurhorst US Patent 6,587,960, 2003	21	2003
A layer-oriented interface for visualizing time-series data from oscilloscopes R Lopez-Hernandez, D Guilmaine, MJ McGuffin, L Barford 2010 IEEE Pacific Visualization Symposium (PacificVis), 41-48, 2010	19	2010
Fourier analysis from networked measurements using time synchronization L Barford, J Burch 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings 3 …, 2005	19	2005
Sequential Bayesian bit error rate measurement L Barford IEEE Transactions on Instrumentation and measurement 53 (4), 947-954, 2004	19	2004
Fast time domain simulation in spice with frequency domain data N Chang, L Barford, B Troyanovsky 1997 Proceedings 47th Electronic Components and Technology Conference, 689-695, 1997	19	1997

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