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Joseph P. Kozak
Joseph P. Kozak
Johns Hopkins University Applied Physics Laboratory
Verified email at vt.edu
Title
Cited by
Cited by
Year
Surge-energy and overvoltage ruggedness of P-gate GaN HEMTs
R Zhang, JP Kozak, M Xiao, J Liu, Y Zhang
IEEE Transactions on Power Electronics 35 (12), 13409-13419, 2020
1122020
Stability, reliability, and robustness of GaN power devices: A review
JP Kozak, R Zhang, M Porter, Q Song, J Liu, B Wang, R Wang, W Saito, ...
IEEE Transactions on Power Electronics 38 (7), 8442-8471, 2023
982023
True Breakdown Voltage and Overvoltage Margin of GaN Power HEMTs in Hard Switching
JP Kozak, R Zhang, Q Song, J Liu, W Saito, Y Zhang
IEEE Electron Device Letters, 2021
642021
Dynamic breakdown voltage of GaN power HEMTs
R Zhang, JP Kozak, Q Song, M Xiao, J Liu, Y Zhang
2020 IEEE International Electron Devices Meeting (IEDM), 23.3. 1-23.3. 4, 2020
572020
Robustness of cascode GaN HEMTs in unclamped inductive switching
Q Song, R Zhang, JP Kozak, J Liu, Q Li, Y Zhang
IEEE Transactions on Power Electronics 37 (4), 4148-4160, 2021
492021
Impact of accelerated stress-tests on SiC MOSFET precursor parameters
JP Kozak, KDT Ngo, DJ DeVoto, JJ Major
2018 Second International Symposium on 3D Power Electronics Integration and …, 2018
342018
Degradation of SiC MOSFETs under High-Bias Switching Events
JP Kozak, R Zhang, J Liu, KDT Ngo, Y Zhang
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2021
312021
Degradation and recovery of GaN HEMTs in overvoltage hard switching near breakdown voltage
JP Kozak, Q Song, R Zhang, Y Ma, J Liu, Q Li, W Saito, Y Zhang
IEEE Transactions on Power Electronics 38 (1), 435-446, 2022
282022
Touch screens: A pressing technology
T Hoye, J Kozak
Tenth Annual Freshman Engineering Sustainability in the New Millennium …, 2010
282010
An Analytical Model for Predicting Turn-on Overshoot in Normally-off GaN HEMTs
JP Kozak, A Barchowsky, MR Hontz, NB Koganti, W Stanchina, G Reed, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2019
272019
A GaN-based modular multilevel DC-DC converter for high-density anode discharge power modules
A Barchowsky, JP Kozak, BM Grainger, WE Stanchina, GF Reed
2017 IEEE Aerospace Conference, 1-10, 2017
252017
Analytical and experimental optimization of external gate resistance for safe rapid turn on of normally off GaN HFETs
A Barchowsky, JP Kozak, MR Hontz, WE Stanchina, GF Reed, ZH Mao, ...
2017 IEEE Applied Power Electronics Conference and Exposition (APEC), 1958-1963, 2017
222017
Trends in SiC MOSFET threshold voltage and on-resistance measurements from thermal cycling and electrical switching stresses
JP Kozak, DJ DeVoto, JJ Major, KDT Ngo
CIPS 2018; 10th International Conference on Integrated Power Electronics …, 2018
212018
Surge energy robustness of GaN gate injection transistors
R Zhang, JP Kozak, J Liu, M Xiao, Y Zhang
2020 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2020
192020
Failure mechanisms of cascode GaN HEMTs under overvoltage and surge energy events
Q Song, R Zhang, JP Kozak, J Liu, Q Li, Y Zhang
2021 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2021
172021
Robustness of cascode GaN HEMTs under repetitive overvoltage and surge energy stresses
Q Song, R Zhang, JP Kozak, J Liu, Q Li, Y Zhang
2021 IEEE Applied Power Electronics Conference and Exposition (APEC), 363-369, 2021
152021
Robustness of GaN gate injection transistors under repetitive surge energy and overvoltage
JP Kozak, Q Song, R Zhang, J Liu, Y Zhang
2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021
152021
Evaluation of 650V, 100A direct-drive GaN power switch for electric vehicle powertrain applications
Q Song, JP Kozak, M Xiao, Y Ma, B Wang, R Zhang, R Volkov, K Smith, ...
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021
142021
Hard-switched overvoltage robustness of p-gate GaN HEMTs at increasing temperatures
JP Kozak, R Zhang, J Liu, Q Song, M Xiao, Y Zhang
2020 IEEE Energy Conversion Congress and Exposition (ECCE), 677-682, 2020
122020
IEEE International Reliability Physics Symposium (IRPS)
R Zhang, JP Kozak, J Liu, M Xiao, Y Zhang
IEEE, Dallas, TX, USA, 1-4, 2020
112020
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