| Design of a tunable LNA and its variability analysis through surrogate modeling X Xhafa, MB Yelten International Journal of Numerical Modelling: Electronic Networks, Devices …, 2020 | 15 | 2020 |
| An automated setup for the characterization of time-based degradation effects including the process variability in 40-nm CMOS transistors X Xhafa, AD Güngördü, D Erol, Y Yavuz, MB Yelten IEEE Transactions on Instrumentation and Measurement 70, 1-10, 2021 | 11 | 2021 |
| Design and validation of an artificial neural network based on analog circuits FB Gencer, X Xhafa, BB İnam, MB Yelten Analog Integrated Circuits and Signal Processing 106, 475-483, 2021 | 6 | 2021 |
| On Using Cell-Aware Methodology for SRAM Bit Cell Testing X Xhafa, A Ladhar, E Faehn, L Anghel, G Di Pendina, P Girard, A Virazel 2023 IEEE European Test Symposium (ETS), 1-4, 2023 | 3 | 2023 |
| Design of An Analog Circuit-Based Artificial Neural Network FB Gencer, X Xhafa, BB İnam, MB Yelten 2019 11th international conference on electrical and electronics engineering …, 2019 | 2 | 2019 |
| Surrogate modeling of high-frequency electronic circuits X Xhafa, MB Yelten Surrogate Modeling for High-Frequency Design: Recent Advances, 381-404, 2022 | 1 | 2022 |
| SRAM Periphery Testing Using the Cell-Aware Test Methodology X Xhafa, E Faehn, P Girard, A Virazel IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024 | | 2024 |
| A Structural Testing Approach for SRAM Address Decoders Using Cell-Aware Methodology X Xhafa, E Faehn, P Girard, A Virazel 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2024 | | 2024 |
| A Graph-Based Methodology for Speeding up Cell-Aware Model Generation G Mongelli, X Xhafa, E Faehn, D Robins, P Girard, A Virazel 2024 IEEE 30th International Symposium on On-Line Testing and Robust System …, 2024 | | 2024 |
| Machine Learning-Based Modeling of Hot Carrier Injection in 40 nm CMOS Transistors X Xhafa, AD Güngördü, MB Yelten IEEE Journal of the Electron Devices Society, 2024 | | 2024 |
| Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies X Xhafa, P Girard, A Virazel 2023 IEEE European Test Symposium (ETS), 1-2, 2023 | | 2023 |
| On Using Cell-Aware Models for Representing SRAM Architecture X Xhafa, A Ladhar, E Faehn, L Anghel, G Di Pendina, P Girard, A Virazel 16e Colloque National du GDR SoC², 2022 | | 2022 |
