| Driving principles of mobile microrobots for micro-and nanohandling A Kortschack, OC Hänßler, C Rass, S Fatikow Proceedings 2003 IEEE/RSJ International Conference on Intelligent Robots and …, 2003 | 22 | 2003 |
| Design and experimental evaluation of a compliant mechanism-based stepping-motion actuator with multi-mode J Wei, S Fatikow, X Zhang, OC Haenssler Smart Materials and Structures 27 (10), 105014, 2018 | 21 | 2018 |
| Publications in journals OC Haenssler, MF Wieghaus, A Kostopoulos, G Doundoulakis, ... JOURNAL OF APPLIED PHYSICS 119, 224305, 2016 | 21 | 2016 |
| Automated calibration of RF on-wafer probing and evaluation of probe misalignment effects using a desktop micro-factory FT von Kleist-Retzow, T Tiemerding, P Elfert, OC Haenssler Journal of Computer and Communications 4 (3), 61-67, 2016 | 16 | 2016 |
| Automated robotic manipulation of individual sub-micro particles using a dual probe setup inside the scanning electron microscope S Zimmermann, T Tiemerding, OC Haenssler, S Fatikow 2015 IEEE International Conference on Robotics and Automation (ICRA), 950-955, 2015 | 15 | 2015 |
| Multi-target tracking for automated RF on-wafer probing based on template matching H Li, FT von Kleist-Retzow, OC Haenssler, S Fatikow, X Zhang 2019 International Conference on Manipulation, Automation and Robotics at …, 2019 | 12 | 2019 |
| Manipulation of Liquid Metal Inside an SEM by Taking Advantage of Electromigration FT von Kleist-Retzow, OC Haenssler, S Fatikow Journal of Microelectromechanical Systems, 2018 | 10 | 2018 |
| Development of an automatic nanorobot cell for handling of carbon nanotubes S Fatikow, V Eichhorn, T Wich, H Hülsen, OC Haenssler, T Sievers Proc. IARP-IEEE/RAS-EURON Joint Workshop on Micron and Nano Robotics, 2006 | 10 | 2006 |
| Depth-detection methods for CNT manipulation and characterization in a scanning electron microscope S Fatikow, V Eichhorn, T Wich, T Sievers, O Hänßler, KN Andersen 2007 International Conference on Mechatronics and Automation, 45-50, 2007 | 8 | 2007 |
| Integration of a Scanning Microwave Microscope and a Scanning Electron Microscope: Towards a new instrument to imaging, characterizing and manipulating at the nanoscale OC Haenssler 2014 international conference on manipulation, manufacturing and measurement …, 2014 | 7 | 2014 |
| Amplitude-phase variation in a graphene-based microstrip line M Yasir, S Fatikow, OC Haenssler Micromachines 13 (7), 1039, 2022 | 6 | 2022 |
| Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors OC Haenssler, S Fatikow, D Theron Journal of Vacuum Science & Technology B 36 (2), 2018 | 6 | 2018 |
| Combined scanning microwave and electron microscopy: A novel toolbox for hybrid nanoscale material analysis K Haddadi, OC Haenssler, K Daffe, S Eliet, C Boyaval, D Theron, ... 2017 IEEE MTT-S International Microwave Workshop Series on Advanced …, 2017 | 6 | 2017 |
| Memristor device characterization by scanning microwave microscopy G Sassine, N Najjari, N Defrance, OC Haenssler, D Theron, F Alibart, ... 2017 International Conference on Manipulation, Automation and Robotics at …, 2017 | 6 | 2017 |
| Near-field scanning millimeter-wave microscope combined with a scanning electron microscope K Haddadi, OC Haenssler, C Boyaval, D Theron, G Dambrine 2017 IEEE MTT-S International Microwave Symposium (IMS), 1656-1659, 2017 | 5 | 2017 |
| Towards robot-based manipulation, characterization and automation at the nanoscale S Fatikow, M Bartenwerfer, OC Haenssler 2019 International Conference on Industrial Engineering, Applications and …, 2019 | 3 | 2019 |
| Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy OC Haenssler, MF Wieghaus, A Kostopoulos, G Doundoulakis, ... Journal of Micro-Bio Robotics 14, 51-57, 2018 | 3 | 2018 |
| Simulation of probe misalignment effects during rf on-wafer probing FT von Kleist-Retzow, OC Haenssler, S Fatikow 2016 41st International Conference on Infrared, Millimeter, and Terahertz …, 2016 | 3 | 2016 |
| Manipulating and characterizing with nanorobotics: In-situ SEM technique for centimeter and millimeter waves OC Haenssler, S Fatikow 2015 40th International Conference on Infrared, Millimeter, and Terahertz …, 2015 | 3 | 2015 |
| Atomic force microscopy for high resolution sidewall scans F Krohs, OC Haenssler, M Bartenwerfer, S Fatikow 2014 International Conference on Manipulation, Manufacturing and Measurement …, 2014 | 3 | 2014 |
Didier Theronchercheur CNRS-IEMN NAM6Verified email at univ-lille.fr
