Daniel Holcomb
Daniel Holcomb
Assistant Professor, University of Massachusetts
Verified email at engin.umass.edu - Homepage
Title
Cited by
Cited by
Year
Power-up SRAM state as an identifying fingerprint and source of true random numbers
DE Holcomb, WP Burleson, K Fu
IEEE Transactions on Computers 58 (9), 1198-1210, 2008
7152008
Initial SRAM state as a fingerprint and source of true random numbers for RFID tags
DE Holcomb, WP Burleson, K Fu
Proceedings of the Conference on RFID Security 7 (2), 01, 2007
3632007
PUFs at a glance
U Rührmair, DE Holcomb
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
952014
Low-power sub-threshold design of secure physical unclonable functions
L Lin, D Holcomb, DK Krishnappa, P Shabadi, W Burleson
Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010
792010
TARDIS: Time and Remanence Decay in SRAM to Implement Secure Protocols on Embedded Devices without Clocks.
A Rahmati, M Salajegheh, DE Holcomb, J Sorber, WP Burleson, K Fu
USENIX Security Symposium, 221-236, 2012
702012
Design as you see FIT: System-level soft error analysis of sequential circuits
D Holcomb, W Li, SA Seshia
2009 Design, Automation & Test in Europe Conference & Exhibition, 785-790, 2009
652009
Physical Design Obfuscation of Hardware: A Comprehensive Investigation of Device-and Logic-Level Techniques
A Vijayakumar, VC Patil, DE Holcomb, C Paar, S Kundu
IEEE Transactions on Information Forensics and Security, 2016
592016
FPGA Side Channel Attacks without Physical Access
C Ramesh, SB Patil, SN Dhanuskodi, G Provelengios, S Pillement, ...
Field-Programmable Custom Computing Machines (FCCM), 2018 IEEE 26th Annual …, 2018
572018
Trajectory model validation using newly developed altitude‐controlled balloons during the International Consortium for Atmospheric Research on Transport and Transformations …
EE Riddle, PB Voss, A Stohl, D Holcomb, D Maczka, K Washburn, ...
Journal of Geophysical Research: Atmospheres 111 (D23), 2006
522006
Incremental SAT-based reverse engineering of camouflaged logic circuits
C Yu, X Zhang, D Liu, M Ciesielski, D Holcomb
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
492017
Oracle-Guided Incremental SAT Solving to Reverse Engineer Camouflaged Logic Circuits
D Liu, C Yu, X Zhang, D Holcomb
Proceedings of Design Automation and Test in Europe (DATE '16), 433-438, 2016
472016
Persistent Clocks for Batteryless Sensing Devices
J HESTER, N TOBIAS, A RAHMATI, L SITANAYAH, D HOLCOMB, K FU, ...
ACM Transactions on Embedded Computing Systems (TECS) 15 (4), 77:1--77:28, 2016
422016
Security Evaluation and Enhancement of Bistable Ring PUFs
X Xu, U Rührmair, DE Holcomb, W Burleson
International Workshop on Radio Frequency Identification: Security and …, 2015
412015
Reliable physical unclonable functions using data retention voltage of SRAM cells
X Xu, A Rahmati, DE Holcomb, K Fu, W Burleson
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
392015
Bitline PUF: building native challenge-response PUF capability into any SRAM
DE Holcomb, K Fu
International Workshop on Cryptographic Hardware and Embedded Systems, 510-526, 2014
362014
DRV-Fingerprinting: using data retention voltage of SRAM cells for chip identification
DE Holcomb, A Rahmati, M Salajegheh, WP Burleson, K Fu
International Workshop on Radio Frequency Identification: Security and …, 2012
362012
Probable cause: the deanonymizing effects of approximate DRAM
A Rahmati, M Hicks, DE Holcomb, K Fu
Proceedings of the 42nd Annual International Symposium on Computer …, 2015
342015
A Design Methodology for Stealthy Parametric Trojans and Its Application to Bug Attacks
S Ghandali, GT Becker, D Holcomb, C Paar
Cryptographic Hardware and Embedded Systems–CHES 2016, 2016
312016
Using statistical models to improve the reliability of delay-based PUFs
X Xu, W Burleson, DE Holcomb
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 547-552, 2016
302016
Nanoscale diffusive memristor crossbars as physical unclonable functions
R Zhang, H Jiang, ZR Wang, P Lin, Y Zhuo, D Holcomb, DH Zhang, ...
Nanoscale 10 (6), 2721-2726, 2018
232018
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