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Junaid Iqbal
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Model-based testing using UML activity diagrams: A systematic mapping study
T Ahmed, J Iqbal, A Ashraf, D Truscan, I and Porres
Computer Science Review 33, 98-112, 2019
1202019
Testing web services with model-based mutation
F Siavashi, J Iqbal, D Truscan, J Vain
Software Technologies: 11th International Joint Conference, ICSOFT 2016 …, 2017
112017
Exhaustive Simulation and Test Generation Using fUML Activity Diagrams
J Iqbal, A Ashraf, D Truscan, I and Porres
CAiSE 2019, LNCS 11483, 1-15, 2019
102019
On the benefits of using aspect-orientation in UPPAAL timed automata
J Vain, D Truscan, J Iqbal, L Tsiopoulos
2017 International Conference on Infocom Technologies and Unmanned Systems …, 2017
32017
A Tool-supported Approach for Introducing Aspects in UPPAAL Timed Automata
D Truscan, J Vain, M Koskinen, J Iqbal
Software Technologies: 9th International Joint Conference, ICSOFT 2014 …, 2015
32015
TRON2UPPAAL Backtracer Tool – From TRON Logs to UPPAAL Traces
J Iqbal, D Truscan, J Vain, Porres, Ivan
Technical report 1138, Turku Centre for Computer Science, 2015
22015
RuRot: run-time rotatable-expandable partitions for efficient mapping in CGRAs
SMAH Jafri, G Serrano, J Iqbal, M Daneshtalab, A Hemani, K Paul, ...
2014 International Conference on Embedded Computer Systems: Architectures …, 2014
22014
MATERA2-AlfTester: An Exhaustive Simulation and Test Generation Tool for fUML Models
J Iqbal, A Ashraf, D Truscan, I Porres
2019 45th Euromicro Conference on Software Engineering and Advanced …, 2019
12019
Reconstructing timed symbolic traces from rtioco-based timed test sequences using backward-induction
J Iqbal, D Truscan, J Vain, I Porres
Proceedings of the Fifth European Conference on the Engineering of Computer …, 2017
12017
Time semantics of Executable Activity Diagrams for relativized conformance testing
J Iqbal, D Truscan, J Vain
MODELS companion Workshops MLE 2020, 2020
2020
The Crisis Management System – A Case Study in Aspect-Oriented Modeling Using UPPAAL
IP Junaid Iqbal, Leonidas Tsiopoulos, Dragos Truscan, Jüri Vain
TUCS Technical Reports, 2016
2016
Aspect-Oriented Modelling in UPPAAL for Compositional Verification and Testing
D Truscan, J Vain, J Iqbal, L Tsiopoulos, I Porres
Tron2Uppaal Back Tracer Tool
J Iqbal, D Truscan, J Vain, I Porres
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Articles 1–13