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Rouwaida Kanj
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Year
Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events
R Kanj, R Joshi, S Nassif
Proceedings of the 43rd annual Design Automation Conference, 69-72, 2006
4002006
Low cost arduino/android-based energy-efficient home automation system with smart task scheduling
K Baraka, M Ghobril, S Malek, R Kanj, A Kayssi
2013 Fifth international conference on computational intelligence …, 2013
1952013
Document retrieval using internal dictionary-hierarchies to adjust per-subject match results
AE Gattiker, FH Gebara, AN Hylick, RN Kanj
US Patent 9,235,638, 2016
1762016
Method and computer program for efficient cell failure rate estimation in cell arrays
RV Joshi, RN Kanj, SR Nassif
US Patent 7,380,225, 2008
1312008
Methodology for correlated memory fail estimations
RV Joshi, RN Kanj, SR Nassif
US Patent 8,214,190, 2012
1112012
In-situ design method and system for improved memory yield
RV Joshi, R Kanj
US Patent 8,170,857, 2012
1042012
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data
F Wang, W Zhang, S Sun, X Li, C Gu
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
1012013
Noninvasive, wearable, and tunable electromagnetic multisensing system for continuous glucose monitoring, mimicking vasculature anatomy
J Hanna, M Bteich, Y Tawk, AH Ramadan, B Dia, FA Asadallah, A Eid, ...
Science Advances 6 (24), eaba5320, 2020
752020
The impact of aging effects and manufacturing variation on SRAM soft-error rate
EH Cannon, AJ KleinOsowski, R Kanj, DD Reinhardt, RV Joshi
IEEE Transactions on Device and Materials Reliability 8 (1), 145-152, 2008
702008
Cross layer error exploitation for aggressive voltage scaling
AK Djahromi, AM Eltawil, FJ Kurdahi, R Kanj
8th International Symposium on Quality Electronic Design (ISQED'07), 192-197, 2007
592007
A novel column-decoupled 8T cell for low-power differential and domino-based SRAM design
RV Joshi, R Kanj, V Ramadurai
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (5), 869-882, 2010
562010
Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layout
DL DeMaris, RN Kanj, DN Maynard, MD Monkowski
US Patent App. 11/765,473, 2008
472008
System-level SRAM yield enhancement
FJ Kurdahi, AM Eltawil, YH Park, RN Kanj, SR Nassif
7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-184, 2006
402006
A disturb decoupled column select 8T SRAM cell
V Ramadurai, R Joshi, R Kanj
2007 IEEE Custom Integrated Circuits Conference, 25-28, 2007
362007
A thermal and process variation aware MTJ switching model and its applications in soft error analysis
P Wang, W Zhang, R Joshi, R Kanj, Y Chen
Proceedings of the International Conference on Computer-Aided Design, 720-727, 2012
332012
FinFET SRAM design
R Joshi, K Kim, R Kanj
Nanoelectronic Circuit Design, 55-95, 2011
312011
Technology computer-aided design (TCAD)-based virtual fabrication
RV Joshi, RN Kanj, K Kim
US Patent 8,515,724, 2013
232013
Strained SOI FinFET SRAM Design
P Kerber, R Kanj, RV Joshi
IEEE electron device letters 34 (7), 876-878, 2013
232013
Systems and methods for memory device precharging
JW Dawson, RV Joshi, N Jungmann, E Kachir, RN Kanj, E Nir, DW Plass
US Patent 8,472,271, 2013
212013
Statistical exploration of the dual supply voltage space of a 65nm PD/SOI CMOS SRAM cell
R Joshi, R Kanj, S Nassif, D Plass, Y Chan
2006 European Solid-State Device Research Conference, 315-318, 2006
212006
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