| Evaluating one-hot encoding finite state machines for SEU reliability in SRAM-based FPGAs M Cassel, F Lima 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006 | 103 | 2006 |
| A high-fault-coverage approach for the test of data, control and handshake interconnects in mesh networks-on-chip E Cota, FL Kastensmidt, M Cassel, M Herve, P Almeida, P Meirelles, ... IEEE Transactions on Computers 57 (9), 1202-1215, 2008 | 95 | 2008 |
| Crosstalk-and SEU-aware networks on chips AP Frantz, M Cassel, FL Kastensmidt, É Cota, L Carro IEEE Design & Test of Computers 24 (4), 340-350, 2007 | 61 | 2007 |
| Redefining and testing interconnect faults in mesh nocs E Cota, FL Kastensmidt, A Amory, M Cassel, M Lubaszewski, P Meirelles 2007 IEEE International Test Conference, 1-10, 2007 | 27 | 2007 |
| A 12nm Agile-Designed SoC for Swarm-Based Perception with Heterogeneous IP Blocks, a Reconfigurable Memory Hierarchy, and an 800MHz Multi-Plane NoC T Jia, P Mantovani, MC Dos Santos, D Giri, J Zuckerman, EJ Loscalzo, ... ESSCIRC 2022-IEEE 48th European Solid State Circuits Conference (ESSCIRC …, 2022 | 5 | 2022 |
| An adaptive low-power receiver architecture for IEEE 802.15. 4 standard MC dos Santos, L Carro 2014 IEEE International Instrumentation and Measurement Technology …, 2014 | 2 | 2014 |
| 22.9 A 12nm 18.1 TFLOPs/W Sparse Transformer Processor with Entropy-Based Early Exit, Mixed-Precision Predication and Fine-Grained Power Management T Tambe, J Zhang, C Hooper, T Jia, PN Whatmough, J Zuckerman, ... 2023 IEEE International Solid-State Circuits Conference (ISSCC), 342-344, 2023 | 1 | 2023 |
| A Scalable Methodology for Agile Chip Development with Open-Source Hardware Components MC Santos, T Jia, M Cochet, K Swaminathan, J Zuckerman, P Mantovani, ... Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022 | 1 | 2022 |
| Adaptive low power receiver combining ADC resolution and digital baseband for wireless sensors networks based in IEEE 802.15. 4 standard MC Santos | | 2015 |
| Redefining and Testing Interconnect Faults in Mesh NoCs ÉCFL Kastensmidt, M Cassel, P Meirelles, A Amory, M Lubaszewski | | |
