Philippe Goudeau
Philippe Goudeau
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Characterisation of Ti1− xSixNy nanocomposite films
F Vaz, L Rebouta, P Goudeau, J Pacaud, H Garem, JP Riviere, ...
Surface and Coatings Technology 133, 307-313, 2000
Structural, optical and mechanical properties of coloured TiNxOy thin films
F Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ...
Thin Solid Films 447, 449-454, 2004
Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films
F Vaz, J Ferreira, E Ribeiro, L Rebouta, S Lanceros-Méndez, JA Mendes, ...
Surface and Coatings Technology 191 (2-3), 317-323, 2005
Improvement of the tribological behaviour of PVD nanostratified TiN/CrN coatings—An explanation
C Mendibide, P Steyer, J Fontaine, P Goudeau
Surface and Coatings Technology 201 (7), 4119-4124, 2006
Structural transitions in hard Si-based TiN coatings: the effect of bias voltage and temperature
F Vaz, L Rebouta, P Goudeau, T Girardeau, J Pacaud, JP Riviere, ...
Surface and Coatings Technology 146, 274-279, 2001
Atomistic calculation of size effects on elastic coefficients in nanometre-sized tungsten layers and wires
P Villain, P Beauchamp, KF Badawi, P Goudeau, PO Renault
Scripta materialia 50 (9), 1247-1251, 2004
Structural analysis of Ti1− xSixNy nanocomposite films prepared by reactive magnetron sputtering
F Vaz, L Rebouta, B Almeida, P Goudeau, J Pacaud, JP Riviere, ...
Surface and Coatings Technology 120, 166-172, 1999
Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films
P Carvalho, F Vaz, L Rebouta, L Cunha, CJ Tavares, C Moura, E Alves, ...
Journal of applied physics 98 (2), 2005
Size effect on intragranular elastic constants in thin tungsten films
P Villain, P Goudeau, PO Renault, KF Badawi
Applied physics letters 81 (23), 4365-4367, 2002
Residual stress states in sputtered Ti1− xSixNy films
F Vaz, L Rebouta, P Goudeau, JP Riviere, E Schäffer, G Kleer, ...
Thin Solid Films 402 (1-2), 195-202, 2002
Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition
L Borgese, M Gelfi, E Bontempi, P Goudeau, G Geandier, D Thiaudière, ...
Surface and Coatings Technology 206 (8-9), 2459-2463, 2012
Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage
F Vaz, P Carvalho, L Cunha, L Rebouta, C Moura, E Alves, AR Ramos, ...
Thin Solid Films 469, 11-17, 2004
Measuring thin film and multilayer elastic constants by coupling in situ tensile testing with x-ray diffraction
KF Badawi, P Villain, P Goudeau, PO Renault
Applied Physics Letters 80 (25), 4705-4707, 2002
New apparatus for grazing X-ray reflectometry in the angle-resolved dispersive mode
A Naudon, J Chihab, P Goudeau, J Mimault
Journal of applied crystallography 22 (5), 460-464, 1989
Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing
D Faurie, PO Renault, E Le Bourhis, P Goudeau
Acta Materialia 54 (17), 4503-4513, 2006
Preparation of magnetron sputtered TiNxOy thin films
F Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ...
Surface and Coatings Technology 174, 197-203, 2003
Poisson’s ratio measurement in tungsten thin films combining an x-ray diffractometer with in situ tensile tester
PO Renault, KF Badawi, L Bimbault, P Goudeau, E Elkaım, JP Lauriat
Applied physics letters 73 (14), 1952-1954, 1998
Atomic force microscopy of in situ deformed nickel thin films
C Coupeau, JF Naud, F Cleymand, P Goudeau, J Grilhé
Thin Solid Films 353 (1-2), 194-200, 1999
Influence of the nanostructuration of PVD hard TiN-based films on the durability of coated steel
P Steyer, A Mege, D Pech, C Mendibide, J Fontaine, JF Pierson, C Esnouf, ...
Surface and Coatings Technology 202 (11), 2268-2277, 2008
Characterization of photoluminescent porous Si by small‐angle scattering of X rays
V Vezin, P Goudeau, A Naudon, A Halimaoui, G Bomchil
Applied physics letters 60 (21), 2625-2627, 1992
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