| Location estimation and uncertainty analysis for mobile robots CM Wang Proceedings. 1988 IEEE International Conference on Robotics and Automation …, 1988 | 277 | 1988 |
| Confidence intervals on nonnegative linear combinations of variances FA Graybill, CM Wang Journal of the American Statistical Association 75 (372), 869-873, 1980 | 195 | 1980 |
| An optimal vector-network-analyzer calibration algorithm DF Williams, JCM Wang, U Arz IEEE Transactions on Microwave Theory and Techniques 51 (12), 2391-2401, 2003 | 160 | 2003 |
| A statistical study of de-embedding applied to eye diagram analysis PD Hale, J Jargon, CMJ Wang, B Grossman, M Claudius, JL Torres, ... IEEE Transactions on Instrumentation and Measurement 61 (2), 475-488, 2011 | 147 | 2011 |
| Hydrogen cyanide H13C14N absorption reference for 1530 nm to 1565 nm wavelength calibration–SRM 2519a SL Gilbert, WC Swann, CM Wang NIST special publication 260-137, 2005 | 130 | 2005 |
| Rotating-polarizer polarimeter for accurate retardance measurement PA Williams, AH Rose, CM Wang Applied optics 36 (25), 6466-6472, 1997 | 128 | 1997 |
| Calibration of sampling oscilloscopes with high-speed photodiodes TS Clement, PD Hale, DF Williams, CM Wang, A Dienstfrey, DA Keenan IEEE Transactions on microwave theory and techniques 54 (8), 3173-3181, 2006 | 117 | 2006 |
| Models and confidence intervals for true values in interlaboratory trials HK Iyer, CMJ Wang, T Mathew Journal of the American Statistical Association 99 (468), 1060-1071, 2004 | 116 | 2004 |
| Verdet constant dispersion in annealed optical fiber current sensors AH Rose, SM Etzel, CM Wang Journal of Lightwave Technology 15 (5), 803-807, 1997 | 114 | 1997 |
| An optimal multiline TRL calibration algorithm DF Williams, CM Wang, U Arz IEEE MTT S International Microwave Symposium Digest 3, 1819-1822, 2003 | 112 | 2003 |
| Compensation of random and systematic timing errors in sampling oscilloscopes PD Hale, CM Wang, DF Williams, KA Remley, JD Wepman IEEE Transactions on Instrumentation and Measurement 55 (6), 2146-2154, 2006 | 107 | 2006 |
| Covariance-matrix-based vector-network analyzer uncertainty analysis for time-and frequency-domain measurements A Lewandowski, DF Williams, PD Hale, CM Wang, A Dienstfrey IEEE Trans. Microwave Theory Tech 58 (7), 1877-1886, 2010 | 100 | 2010 |
| Covariance-based uncertainty analysis of the NIST electrooptic sampling system DF Williams, A Lewandowski, TS Clement, JCM Wang, PD Hale, ... IEEE Transactions on Microwave Theory and Techniques 54 (1), 481-491, 2006 | 90 | 2006 |
| Configuring and verifying reverberation chambers for testing cellular wireless devices KA Remley, J Dortmans, C Weldon, RD Horansky, TB Meurs, CM Wang, ... IEEE Transactions on Electromagnetic Compatibility 58 (3), 661-672, 2016 | 76 | 2016 |
| Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty K Remley, DF Williams, PD Hale, CM Wang, J Jargon, Y Park IEEE Transactions on Microwave Theory and Techniques 63 (5), 1710-1720, 2015 | 73 | 2015 |
| Fiducial prediction intervals CM Wang, J Hannig, HK Iyer Journal of Statistical Planning and Inference 142 (7), 1980-1990, 2012 | 64 | 2012 |
| Traceable waveform calibration with a covariance-based uncertainty analysis PD Hale, A Dienstfrey, JCM Wang, DF Williams, A Lewandowski, ... IEEE Transactions on Instrumentation and Measurement 58 (10), 3554-3568, 2009 | 62 | 2009 |
| A Significance Test for Reverberation-Chamber Measurement Uncertainty in Total Radiated Power of Wireless Devices KA Remley, CMJ Wang, DF Williams, CL Holloway IEEE Transactions on Electromagnetic Compatibility 58 (1), 207-219, 2016 | 61 | 2016 |
| Electromagnetic measurements for counterfeit detection of radio frequency identification cards HP Romero, KA Remley, DF Williams, CM Wang IEEE Transactions on Microwave Theory and Techniques 57 (5), 1383-1387, 2009 | 61 | 2009 |
| Estimating the magnitude and phase response of a 50 GHz sampling oscilloscope using the" nose-to-nose" method PD Hale, TS Clement, KJ Coakley, CM Wang, DC DeGroot, AP Verdoni 55th ARFTG Conference Digest 37, 1-8, 2000 | 61 | 2000 |
Dylan F WilliamsNational Institute of Standards and TechnologyVerified email at nist.gov
